Články

 

2000

Jurečka S., Šutta P., Havlík M.: Fourierova a waveletová filtrácia rtg difrakčných profilov. In: Smery vývoja techniky pozemného vojska. Vojenská akadémia Liptovský Mikuláš 29.-30.11. 2000, p. 204-208.

2001

Jurečková M., Jurečka S.: Excel v štatistickom testovaní hypotéz. Zborník vedeckých prác Vojenskej akadémie L. Mikuláš 2001, Vol. 8, No.3., p. 27-35.

2001

Jurečka S., Müllerová J., Kučerová A., Parulek I.: Laboratórne cvičenia z fyziky. Vojenská akadémia L. Mikuláš 2001.

2001

Jurečka S., Havlík M.: Porovnanie aproximačných a Fourierovských dekonvolučných metód pri analýze rtg difrakčných profilov.  Materials Structure 2001, Vol.8, No.2, p.82-86.

2001

Jurečka S., Müllerová J.: Determination of optical parameters of thin films using genetic algorithm. In: Proceedings of Applied Physics of Condensed Matter APCOM 2001. L. Mikuláš 2001, p.194-198.

2001

Jurečka S.: Difrakcia žiarenia elementárnou bunkou kryštalickej mriežky. In: International seminar ISAA 2001. Vojenská akadémia L. Mikuláš 2001, s.52-56.

2002

Jurečka S., Müllerová J., Kučerová A.: Genetic algorithm optimizer for optical characterization of oxide thin films. In: Proceedings of Applied Physics of Condensed Matter APCOM 2002, L. Mikuláš 2002, p. 198-202.

2002

Jurečka S., Müllerová J., Jurečková M.: Genetic algorithm approach to thin film optical parameters determination. In: Proceedings of Solid State Surfaces and Interfaces SSSI III, Smolenice Castle 2002, p,.38-39.

2002

Müllerová J., Jurečka S., Kučerová A.: Extraction of optical parameters of thin films from spectral measurements for optical design and optical performance of multilayer structures. In: Proceedings of Solid State Surfaces and Interfaces SSSI III, Smolenice Castle 2002, p. 48-51

2003

Müllerová J., Jurečka S., Kučerová A.: Extraction of optical parameters of thin films from spectral measurements for optical design and optical performance of multilayer structures. Acta Physica Slovaca 2003, Vol. 53, No.2, p.111-119.

2003

Jurečka S., Jurečková M.: The Volterra filter application in the experimental diffraction data processing. Central European Journal of Physics CEJP 2003, No.3, p. 440-452.

2003

Jurečka S., Müllerová J., Jurečková M.: Thin film optical parameters characteization from the transmittance spectral measurements: Genetic algorithm method. In: Proceedings of Applied Physics of Condensed Matter APCOM 2003, Malá Lučivná – University of Žilina, 2003, p.36-39.

2003

Müllerová J., Jurečka S.: Influence of TCO layer optical properties on reflectance losses of single-junction solar cells: optical modeling with ITO and ZnO thin films. In: Proceedings of Applied Physics of Condensed Matter APCOM 2003, Malá Lučivná – University of Žilina, 2003, p. 24-27.

2003

Jurečka S., Jurečková M., Müllerová J..: Genetic algorithm approach to thin film optical parameters determination. Acta Physica Slovaca 2003, Vol. 53, No. 2, p. 215-221.

2003

Müllerová J., Jurečka S., Kučerová A.: Extraction of optical parameters of thin films from spectral measurements for design and optical performance of multilayer structures. In: Proceedings of 3rd SSSI Solid State Surfaces and Interfaces III. Smolenice Castle 2003.

2003

Jurečka S., Šutta P., Miškufová A., Havlík T.: Štúdium vývoja mikroštruktúry práškového CaCO3 pri mletí vo vibračnom mlyne. Materials Structure 2003, Vol.10, No.2, p. 86-88.

2004

Jurečka, S., Müllerová, J., Pinčík, E.: Numerical solution of optical parameters of a-Si:H thin film from the spectral reflectance measurements. In: Proceedings of the International Conference Silicon – News in Science and Technology SNST 2004, Fe39bruary 29 – March 3, 2004 Podbanské: Publishing Centre of Faculty of Mathematics, Physic and Informatics, Comenius University, Bratislava, 2004. p. 64 – 70.

2004

Jurečka S., Havlík M., Jurečková M.: Genetická syntéza difrakčného profilu. Advances in Electrical and Electronic Engineering 2004, Vol. 3, No. 1, p. 27-30.

2004

Hockicko P., Bury P.,Jurečka S., Jamnický M., Jamnický I.: Analysis of acoustic spectra reflecting ion transport processes in glassy electrolytes. Advances in Electrical and Electronic Engineering  2004, Vol. 3, No. 2, p. 243 246.

2004

Hockicko P., Jurečka S., Bury P., Jamnický M., Jamnický I.: An acoustic attenuation theoretical models for the ion conductive glasses. In: Proceedings of Applied Physics of Condensed Matter APCOM 2004. June 16-18, 2004, Častá – Píla – Bratislava: Slovak University of Technology,  p. 96 – 99.

2004

Hockicko P., Bury P., Jurečka S., Jamnický J., Jamnický I.: Acoustic Spectroscopy Investigation of Ion Conductive Glasses of the System CuI-CuBr-Cu2O-P2O5. Proceedings of the 8th International Colloquium ACOUSTICS '04, Zvolen, September 8 - 10, 2004, p. 25 - 29.

2004

Bury P., Hockicko P., Jurečka S., Jamnický J.: Analysis of Acoustic Attenuation Spectra Due to Ion Transport Processes in Glassy Electrolytes. Physica Status Solidi 2004, No. 11, p. 2888-2891.

2004

Hockicko P., Bury P., Jurečka S., Jamnický J.: The Investigation of Transport Processes in Ion Conductive Glasses Using Acoustical and Electrical Spectroscopy. Proceedings of the International conference New Trends in Physics – NTF 2004, Brno 2004.

2004

Jurečka S., Müllerová J., Pinčík E.: Determination of optical parameters of a-Si:H thin films by the visual modeling method. In: Proceedings of the 10th International Workshop on Applied Physics of Condensed Matter APCOM 2004, June 16-18, 2004, Častá – Píla – Bratislava: Slovak University of Technology, 2004. p. 108 – 112.

2004

Jurečka S., Šutta P.: X-ray microstructure analysis by the Rietveld method. In: Proceedings of the 10th International Workshop on Applied Physics of Condensed Matter APCOM 2004, June 16-18, 2004, Častá – Píla – Bratislava: Slovak University of Technology, 2004. p. 113 – 116.

2004

Müllerová J., Šutta P., Jurečka S., Mikula M.: Effect of hydrogen dilution on optical and structural properties of PECVD deposited a-Si:H thin films. In: Proceedings of the 10th International Workshop on Applied Physics of Condensed Matter APCOM 2004, June 16-18, 2004, Častá – Píla – Bratislava: Slovak University of Technology, 2004. p. 173 – 176.

2004

Pinčík, E., Kobayashi, H., Jergel, M., Glesková, H., Jurečka, S., Takahashi, M., Brunner, R., Fujiwara, N.: Investigation of electrical, structural and optical properties of very thin oxide/a-Si:H/c-Si interfaces passivated by cyanide treatment. In: Proceedings of the Fifth International Conference on Thin Film Physics and Applications (TFPA), May 31 –  June 2, 2004, Shanghai, China. Published by: Chinese Physical Society; Shanghai Physical Society and East China Normal University, Editor: Prof. Lianwei Wang, p. 58.

2004

Müllerová, J., Jurečka, S., Šutta, P.: Structural and optical studies of Si thin films: from amorphous to nanocrystalline silicon. In: Abstracts Book of the 4th International Workshop on Solid State Surfaces and Interfaces SSSI 2004, November 8 11, 2004, Smolenice Castle, p.44.

2004

Brunner, R., Kobayashi, H., Jurečka, S., Jergel, M., Rusnák, J., Takahashi, N., Fujiwara, N., Müllerová, J., Pinčík, E.: Investigation of electrical, structural and optical properties of very thin oxide/a-Si:H/c-Si interfaces passivated by cyanide treatment. In: Abstracts Book of the 4th International Workshop on Solid State Surfaces and Interfaces SSSI 2004, November 8-11, 2004, Smolenice Castle, p.45.

2004

Jurečka, S., Müllerová, J., Pinčík, E.: Thin Film Optical Parameters Determination by the Visual Modeling and Stochastic Optimization Method. In: Abstracts Book of the 4th International Workshop on Solid State Surfaces and Interfaces SSSI 2004, November 8 11, 2004, Smolenice Castle, p.56.

2005

Müllerová J., Jurečka S., Šutta P.: Optical characterization of polysilicon thin films for solar applications. 10-11. In: Brief proceedings of the Solar Renewable Energy News – Research and Application 2005. Florence, Italy 2-8 April 2005. Comenius University, Bratislava 2005, p. 10-11.

2005

Rusnák J., Kákoš J., Brunner R., Jurečka S., Pinčík E.: On chemically prepared ultra-thin SiOx/epitaxial Si/c-Si structures. In: Brief proceedings of the Solar Renewable Energy News – Research and Application 2005. Florence, Italy 2-8 April 2005. Comenius University, Bratislava 2005, p.12.

2005

Müllerová J., Jurečka S., Šutta P., Mikula M.: Structural and optical studies of a-Si:H thin films: from amorphous to nanocrystalline silicon. Acta Physica Slovaca 2005, Vol.55, No.3, p.351-359.

2005

Rusnák J., Kákoš J., Brunner R., Jurečka S., Pinčík E.: On chemically prepared ultra-thin SiOx/epitaxial Si/c-Si structures. Brief proceedings of the Solar Renewable Energy News - Research and Application 2005. Florence, Italy 2-8 April 2005. Comenius University, Bratislava 2005, p.12., ISBN 80-223-2048-X

2005

Jurečka S., Černík M.: Steel sample microstructure determination by the x-ray diffraction methods. Proceedings of the 11th International Workshop on Applied Physics of Condensed Matter APCOM 2005, Malá Lučivná, June 15 - 17, 2005, p.209-212.

2005

Müllerová J., Jurečka S., Šutta P.: Microstructure of polysilicon thin films deposited with hydrogen dilution. Proceedings of the 11th International Workshop on Applied Physics of Condensed Matter APCOM 2005, Malá Lučivná, June 15 - 17, 2005, p.171-174.

2005

Hockicko P., Bury P., Jurečka S., Jamnický M., Jamnický I.: Analysis of conductivity spectra in ionic phosphate glasses. Proceedings of the 11th International Workshop on Applied Physics of Condensed Matter APCOM 2005, Malá Lučivná, June 15 - 17, 2005, p.239-242.

2005

Jurečka S.: Spracovanie rtg experimentálnych údajov pre analýzu profilu difrakčnej čiary kovových vrstiev a povrchov. Dizertačná práca. Technická univerzita Košice, 2005.

2005

Müllerová, J., Šutta, P., Jurečka, S.: Characterization of the amorphous to polycrystalline transition with nano-size grains in PECVD growth of SiH: optical and structural properties. In: Proceedings of 1st International workshop Semiconductor Nanocrystals SEMINANO, Budapest, Hungary, 10. 9. - 12. 9. 2005, p.97 - 102, 2 Vol., ISBN 963-7371-19-2, ISBN 963-7371-18-4.

2006

Jurečka S., Mülerová J.: Thin film optical parameters determination by the dynamical modeling and stochastic optimization method. Komunikácie - Communications 2006, No.1, p.22-24.

2006

Müllerová J., Šutta P., Jurečka S.: Thin film silicon in photovoltaics: the role of structure and microstructure. Komunikácie - Communications 2006, No.1, p.5-9.

2006

Jurečka S., Pinčík E., Brunner R.: Thin film solar cells and their optical properties. Advances in Electrical and Electronic Engineering 2006, Vol.5, No.1-2, p.347-349.

2006

Müllerová J., Jurečka S., Šutta P: Optical characterization of polysilicon thin films for solar applications. Solar Energy 2006, Vol.80, No.6, p.667-674.

2006

Jurečka S., Jurečková M.: Simulácia fyzikálnych systémov a ich implementácia vo vyučovaní prírodovedných predmetov.In: Informačné technológie vo vzdelávaní a vede [elektronický zdroj] : odborný seminár : 19. apríla 2006 : Akadémia ozbrojených síl gen. M. R. Štefánika Liptovský Mikuláš, 2006. ISBN 80-8040-296-5

2006

Jurečka S., Pinčík E., Brunner R.: Solution of the optical parameters of CN treated thin films. Solid State Surfaces and Interfaces. Smolenice Castle 19-24.11.2006.

2007

Jurečka S., Pinčík E., Brunner R.: Comparison of optical models for thin film system optical parameters dermination. Science & Military 2006, Vol.1, No.2, pp.32-35.

2007

Pinčík E., Kobayashi H., Takahashi M., Brunner R., Jurečka S., Rusnák R.: On formation of thin SiO2/a-Si:H interface when biased oxidized semiconductor surface interacts with plasma or liquid solution. Central European Journal of Physics, CEJP 5(3)2007,428-445.

2007

Jurečka S., Pinčík E., Brunner R.: Optical properties of multilayer semiconductor structures. Proceedings of the Applied Physics of Condensed Matter APCOM 2007, Hotel Bystrá, Jánska dolina, June 27 - 29, 2007, p.108-112.

2008

Jurečka S., Pinčík E., Brunner R.: Solution of the optical parameters of the thin film systems and interfaces. Applied Surface Science 2008, Vol.254, No.12, p.3672-3676.

2008

Jurečka S., Jurečková M., Kobayashi H., Takahashi M., Madani M., Pinčík E.: Statistical and fractal properties of semiconductor surface roughness. Advances in Electrical and Electronic Engineering 2008, Vol.7, No.1-2, p.377-381.

2008

Jurečka S., Pinčík E., Kobayashi H, Takahashi M..: Microstructural and optical properties of Si/a-SiC:H/SiO2 thin films. Proceedings of the Applied Physics of Condensed Matter APCOM 2008, KRU Bystrá, Liptovský Ján, June 25 - 27, 2008, p.96-100.

2008

Kopani M., Jergel M., Kobayashi H., Takahashi M., Brunner R., Mikula M., Imamura K., Jurecka S., Pincik E: On determination of properties of ultrathin and very thin silicon oxide layers by FTIR and X-ray reflectivity. in Amorphous and Polycrystalline Thin-Film Silicon Science and Technology, edited by A. Flewitt, J. Hou, S. Miyazaki, A. Nathan, and J. Yang (Mater. Res. Soc. Symp. Proc. Volume 1066, Warrendale, PA, 2008), 1066 – A07 – 03.

2008

E. Pinčík, H. Kobayashi, R. Brunner, M. Takahashi, K. Imamura, M. Kučera, T. Shishido, J. Rusnák, T. Matsumoto, M. Jergel, M. Madani, M. Mikula, M. Uragou, S. Jurečka, and M. Kopani On Electrical, Optical and Structural Properties of Si-based Structures. In: Extended abstract book of 6th solid state surfaces and interfaces (6th SSSI), Smolenice, Slovakia, November 24-27, 2008, 92, ISBN 978-80-223-2566-0, ed. R. Brunner.

2009

Kopani M., Miglierini M., Lancok A., Jurecka S., Dekan J., Melnik M., Sisovsky V., Mikula M., Manka J., Skratek M., Danihel L., Jakubovsky J.: Structural Characterization of Iron in Human Spleen. in Mechanics of Biological and Biomedical Materials, ed. R. Narayan (Mater. Res. Soc. Symp. Proc. Vol. 1132E, Warrendale, PA, 2009), 1132-Z07-03.

2009

Jurečka S., Kobayashi H., Takahashi M., Brunner R., Madani M., Pinčík E.: On topographic properties of semiconductor surfaces and thin film systems. Materials Science Forum, Vol. 609(2009)275-279, Book Thin Films and Porous Materials, doi: 10.4028/3-908454-02-6.275.

2009

Stanislav Jurečka, Mária Jurečková, Ferdinand Chovanec, Hikaru Kobayashi, Masao Takahashi, Milan Mikula, Emil Pinčík: On the topographic and optical properties of SiC/SiO2 surfaces. CEJP Vol.7, No.2, 2009, 321-326.

2009

Stanislav Jurečka, Mária Jurečková, Ferdinand Chovanec, Emil Pinčík: Characterization of the surfaces of semiconductor systems by fractals Proceedings of the 15th International Conference on Applied Physics of Condensed Matter, June 24-26. 2009, KRÚ Bystrá Liptovský Ján, pp. 270-273.

2009

E. Pinčík, H. Kobayashi, J. Rusnák, W.B. Kim, R. Brunner, M. Takahashi, S. Jurečka, M. Kučera, M. Mikula:
On HCN passivated very-thin oxide/Si structures prepared by high-tempeature and low-temperature wet chemical process
Progress in applied surface, interface and thin film science, November 16-19, 2009, Florence, Italy. Extended abstract book, p.157-8.

2010

Hockicko P., Bury P., Sidor P., Jurečka S., Jamnický I.:
Mathematical models for acoustic spectra simulation
Communications - Scientific letters of the University of Žilina No.1, 2010, pp.44-49. ISSN 1335-4205

2010

Jurečka Stanislav, Kobayashi Hikaru, Takahashi Masao, Matsumoto Taketoshi, Jurečková Mária, Chovanec Ferdinand, Pinčík Emil:
On the influence of the surface roughness onto the ultrathin SiO2/Si structure properties
Applied Surface Science, 256(2010)5623-5628.

2010

Jurečka S., Jamnický I.:
Study of the density of states distribution in the SiO2/Si structure
Communications - Scientific letters of the University of Žilina Vol.12, No.2,2010, 58-61.

2010

Jurečka S., Ohnaka A., Kobayashi H.:
Study of structural and optical properties of textured semiconductor surfaces.
Proceedings of the 16th International Conference on Applied Physics of Condensed Matter, APCOM 2009, June 16-18. 2010, Malá Lučivná, pp. 268-273.

2010

Jurečka S., Müllerová J.:
Study of structural and optical properties of a-Si:H thin films.
17th Slovak-Czech-Polish Optical Conference "Wave and quantum aspects of contemporary optics", SCPOC 2010, Sptember 6-10. 2010, Liptovský Ján.[Book of abstracts]

2010

Stanislav Jurečka, Woo-Byoung Kim, Masao Takahashi, Hikaru Kobayashi, Emil Pinčík:
Study of interface states in MOS structure with ultrathin NAOS oxide.
7th Solid state surfaces and interfaces, SSSI 2010, November 22-25. 2010, Smolenice Castle. Extended abstract book, Comenius University 2010, ISBN 978-80-223-2938-5.

2011

Stanislav Jurečka:
Theoretical Model of the Physical System: Optimization by the Genetic Algorithm.
In: Ioannis Dritsas: Stochastic Optimization - Seeing the Optimal for the Uncertain. InTech, Vienna, 2011. ISBN 978-953-307-829-8.
http://www.intechopen.com/articles/show/title/theoretical-model-of-the-physical-system-optimization-by-the-genetic-algorithm

2011

Jurečka S.:
The cavity resonator design: stochastic optimization of the transmission line model.
Book of Abstracts, Photonics Prague 2011, The 7th International Conference on Photonics, Devices and Systems. August 24-26. 2011, Prague., Ed. Pavel Tománek, pp. 40. ISBN 978-80-86742-30-4

2011

Jurečka S., Kobayashi H., Kim W.B., Pinčík E.:
Properties of charge states in MOS structure with ultrathin oxide layer.
In: VII International Workshop on Semiconductor Surface Passivation, Kraków, Poland, 11-15.9.2011. Abstrats, p.29

2011

Jurečka S., Müllerová J., Dado M.:
The cavity resonator design: stochastic optimization of the transmission line model.
Photonics, Devices, and Systems V (Proceedings Volume), Proceedings of SPIE Volume: 8306, Editor(s): Pavel Tománek; Dagmar Senderáková; Petr Páta, Date: 11 October 2011, ISBN: 9780819489531, 464 pages;
http://spie.org/x648.html?product_id=906916&origin_id=x4323&start_year=2011&end_year=2011

2011

Stanislav Jurečka, Hikaru Kobayashi, Woo-Byoung Kim, Masao Takahashi, Emil Pinčík:
Study of density of interface states in MOS structure with ultrathin NAOS oxide.
CEJP Vol.10, No.1, 2012, pp.210-217, DOI: 10.2478/s11534-011-0092-6

2011

Jurečka S., Kobayashi H., Matsumoto T., Takahashi M., Pinčík E.:
Fyzika slnečného článku.
Zborník Alternative Energy Resources, ALER 2011, EF Žilinská univerzita - Slovenská elektrotechnická spoločnosť, Liptovský Ján, Hotel UNA, 06-07.10.2011. [DVD nosič], pp 9-17. ISBN 978-80-554-0427-1

2012

Jurečka S., Kobayashi H., Pinčík E.:
Physics-based models for evaluating of MOS capacitors with ultrathin oxide layer.
Progress in Applied Surface, Interface and Thin Film Science 2012, May 14-18.2012, Florence, Italy, Extended abstract book, Comenius University Bratislava 2012, pp 41-44. ISBN 978-80-223-3212-5

2012

Jurečka S., Kobayashi H., Takahashi M., Matsumoto T., Pinčík E.:
Properties of charge states in MOS structure with ultrathin oxide layer.
http://dx.doi.org/10.1016/j.apsusc.2012.05.001

2012

Emil Pinčík, Hikaru Kobayashi, Jaroslav Rusnák, Masao Takahashi, Robert Brunner, Stanislav Jurečka:
Passivation of Si-based structures in KCN and HCN solutions and its application on solar cell parameters.
Alternative energy resources, ALER 2012. CD nosič SES L. Mikuláš, p. 156-169.

2012

Stanislav Jurečka, Hikaru Kobayashi, Woo-Byoung Kim, Masao Takahashi, Emil Pinčík:
Study of density of interface states in MOS structure with ultrathin NAOS oxide.
CEJP Vol.10, No.1, 2012, pp.210-217, DOI: 10.2478/s11534-011-0092-6

2012

Stanislav Jurečka, Hikaru Kobayashi, Masao Takahashi, Taketoshi Matsumoto, Emil Pinčík:
Properties of charge states in MOS structure with ultrathin oxide layer.
Applied Surface Science 258(2012)8409-8414

2012

Emil Pinčík, Hikaru Kobayashi, Jaroslav Rusnák, Masao Takahashi, Milan Mikula, Woo Byoung Kim, Michal Kučera, Robert Brunner, Stanislav Jurečka:
Passivation of Si-based structures in HCN and KCN solutions.
Applied Surface Science 258(2012)8397-8405

2013

Stanislav Jurečka, Jarmila Müllerová, Emil Pinčík:
Optical methods for analysis of thin dielectric films.
Proceedings of the 19th International conference on Applied Physics of Condensed Matter. June 19-21.2013, Hotel Patria Štrbské Pleso, Nakladateľstvo STU Bratislava, p. 233-236. ISBN 978-80-227-3956-6

2013

Emil Pinčík, Hikaru Kobayashi, Masao Takahashi, Róbert Brunner, Stanislav Jurečka:
Passivation of a-Si:H-based structures in KCN and HCN solutions and its application on p-i-n solar cell.
Journal od the Chinese Advanded Materials Society, Vol.1, No.2, 2013, p.151-165, Taylor & Francis, http://dx.doi.org/10.1080/22243682.2013.808063

2013

P. Bury, D. Pudiš, I. Martinček, B. Trpišová, S.Jurečka, J Kúdelčík:
Fyzika 1.
EDIS, Žilinská univerzita v Žiline, 2013. ISBN 978-80-554-0709-8

2014

S. Jurečka, H. Angermann, H. Kobayashi, M. Takahashi, E. Pinčík:
Multifractal analysis of textured silicon surfaces.
Applied Surface Science 301(2014)46-50.

2015

E. Pincik, H. Kobayashi, T. Matsumoto, M. Mikula, M. Kopani, S. Jurecka, R. Brunner, J. Rusnak: Physical properties of very thin HfO2/ultrathin SiO2/Si structures and their comparison with KCN passivated MOS structures 39th Workshop on Compound Semiconductor Devices and Integrated Circuits WOCSDICE 2015 8-10.6.2015 Smolenice, p.107-109

2015

S. Jurecka, K. Imamura, T. Matsumoto, H. Kobayashi: Study of microstructure and optical properties of nanotextured Si surfaces Proceedings ADEPT 2015, 3rd International Conference on ADVANCES IN ELECTRONIC AND PHOTONIC TECHNOLOGIES, Strbske Pleso, 01-04.06.2015, p. 116-119.

2015

S. Jurecka: ANALYSIS OF ELECTRICAL PROPERTIES OF SEMICONDUCTOR SOLAR CELLS Proceedings APCOM 2015, Hotel Patria, Strbske Pleso, 24-26.06.2015

2015

S. Jurecka: Investigation of tunneling current in semiconductor systems ALER 2015, Hotel Mních, L. Mikuláš, 7-9.10.2015

2015

JUREČKA, Stanislav - MATSUMOTO, Taketoshi - IMAMURA, Kentaro - KOBAYASHI, Hikaru: Multifractal analysis and optical properties of nanostructured silicon layers. In: SURFINT - SREN IV : progress in applied surface, interface and thin film science 2015 : November 23-26, 2015 Florence, Italy. Comenius University Press, 2015, ISBN 978-80-223-3975-9, p. 72-73.

2016

JUREČKA S., Scholtz L., Ladányi L., Müllerová J. Analysis of linear and nonlinear effects in optical fiber. In: Proceedings of SPIE Vol. 10142, 1014203-1 : 20th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics. - 2016. - S. 1014203_1-7.

2016

JUREČKA S., Matsumoto T., Imamura K., Kobayashi H. Morphological properties of nanotextured structures prepared on Si surfaces. In: APCOM 2016, proceedings of the 22nd international conference on Applied physics of condensed matter, June 22-24, 2016, Štrbské Pleso, Slovak Republic. - Bratislava: Slovenská technická univerzita, 2016. - ISBN 978-80-227-4572-7. - S. 183-187.

2016

JUREČKA, Stanislav, IMAMURA, Kentaro, MATSUMOTO, Taketoshi, KOBAYASHI, Hikaru: Properties of nanocrystalline Si layers embedded in structure of solar cell. In: Proceedings of 9th Solid State Surfaces and Interfaces. Bratislava : Comenius University, 2016, ISBN 978-80-223-4203-2, p. 43.

2017

JUREČKA, Stanislav: Optical properties of nanostructured silicon layers In: APCOM 2017, p.227-231

2017

JUREČKA, Stanislav, IMAMURA, Kentaro, MATSUMOTO, Taketoshi, KOBAYASHI, Hikaru: Multifractal analysis and optical properties of nanostructured silicon layers APSUSC 395(2017)150-156

2017

JUREČKA S.,JUREČKOVA M.: Statistical and fractal analysis of random height function Communications Vol. 19, No.3, 2017, 57-61

2017

JUREČKA, Stanislav, IMAMURA, Kentaro, MATSUMOTO, Taketoshi, KOBAYASHI, Hikaru: Analysis of photoluminiscence in the ncSi-DMA system Communications Vol. 19, No.3, 2017, 21-25

2017

JUREČKA, Stanislav, IMAMURA, Kentaro, MATSUMOTO, Taketoshi, KOBAYASHI, Hikaru: Properties of nanocrystalline layers embedded in structure of solar cells Journal of Electrical Engineering Vol. 68, No. 7, 2017, 48-52



 

 

 

 

Prezentácie na konferenciách


1

Šutta P., Jurečka S.:
Gold/Palladium diffusion layers created during physical vapor deposition investigated by the X-ray diffraction
.  Solid State Surfaces and Interfaces 2000, Hotel Družba, Bratislava, 20.-22.6.2000.

2

Jurečka S., Havlík M.:
Porovnanie aproximačných a fourierovských dekonvolučných metód pri analýze rtg difrakčných profilov
. Kolokvium Krystalografické spolecnosti "Struktura". Bedřichov, 2001.

3

Jurečka S.:
Využitie difrakčných metód pri analýze vlastností materiálov
. Odborný seminár. Hutnícka fakulta TUKE 2001.

4

Jurečka S.:
Difrakcia žiarenia základnou bunkou kryštálovej mriežky
. International seminar ISAA 2001. Vojenská  akadémia  Liptovský Mikuláš 2001.

5

Jurečka S., Havlík M.:
Porovnanie aproximačných a fourierovských dekonvolučných metód pri analýze rtg difrakčných profilov
.
Kolokvium Krystalografické spolecnosti "Struktura". Bedřichov, 2001.

6

Jurečka S., Šutta P., Miškufová A., Havlík T.:
Štúdium vývoja mikroštruktúry práškového CaCO3 pri mletí vo vibračnom mlyne
. RPDK 2002. Demänovská dolina, L. Mikuláš 2002.

7

Jurečka S., Müllerová J., Jurečková M.:
Genetic algorithm approach to thin film optical parameters determination
. In: Proceedings Solid State Surfaces and Interfaces III, Smolenice Castle 2002.

8

Jurečka S., Šutta P., Miškufová A., Havlík T.:
Štúdium mikroštruktúry CaCO3 Rietveldovou metódou
. 257. Rozhovory o otázkach v rtg štruktúrnej analýze. STU Trnava, CSCA Kryštalografická spolocnosť 2002.

9

S. Jurečka, P. Šutta, T. Havlík, A. Miškufová:
Rietveldove metódy a určovanie veľkosti častíc
. Konferencia RPDK 2004, Demänovská dolina, L. Mikuláš 22-24.9.2004.

10

Jurečka, S.:
Determination of optical parameters of a-Si thin films by the visual modelling method
. 10th International Workshop on Applied Physics of Condensed Matter APCOM 2004, Častá – Píla, June 16 18, 2004.

11

Jurečka, S.:
Numerické metódy analýzy fyzikálnych systémov: genetické algoritmy
. Katedra základov inžinierstva EF ŽU, 2004.

12

Jurečka, S.:
Vizuálne metódy analýzy fyzikálnych systémov: fyzika dynamicky
. Katedra základov inžinierstva EF ŽU, 8 Jún 2005.

13

Jurečka S., Müllerová J.:
Tenkovrstvové solárne články a ich optické vlastnosti
. ALEL DP EF ŽU, 10 November 2005.

14

Jurečka S., Černík M.:
Steel sample microstructure determination by the x-ray diffraction methods.
APPLIED PHYSICS OF CONDENSED MATTER APCOM 2005, Malá Lučivná, June 15 - 17, 2005

15

J. Rusnák, J. Kákoš, R. Brunner, S. Jurečka and E. Pinčík :
On chemically prepared very thin SiOx/epitaxial Si/c-Si structures.
SREN 2005, Florencia, Taliansko.

16

Jurečka S., Jurečková M.:
Simulácia fyzikálnych systémov a ich implementácia vo vyučovaní prírodovedných predmetov
. Informačné technológie vo vyučovaní a vede, Akadémia ozbrojených síl, L. Mikuláš 19.4.2006.

17

Jurečka S., Pinčík E., Brunner R.:
Thin film solar cells and their optical properties.
ELEKTRO 2006, Žilinská univerzita 23-24.5.2006

18

Jurečka S., Pinčík E., Brunner R.:
Thin film solar cells and their optical properties.
ELEKTRO 2006, Žilinská univerzita 23-24.5.2006

19

Jurečka S., Pinčík E., Brunner R.:
Solution of the optical parameters of the thin film systems and interfaces.
Solid State Surfaces and Interfaces, Smolenice Castle 19-24.11.2006

20

Jurečka S., Jurečková M.:
Modelovanie dynamických systémov vo vyučovaní.
Elektronická prezentácia vo vzdelávaní. Pedagogická fakulta UMB, Katedra matematiky. Banská Bystrica, 5.2.2007. www.pdf.umb.sk/2006/app/index.php?ID=579

21

Jurečka S.:
Optical properties of multilayer semiconductor structures.
Elektronická prezentácia pre výskumnú skupinu Masao Takahashi - Masahide Uragou - Takeru Shishido, Department of functional ceramics, Kobayashi laboratories, Osaka University, Japan. L. Mikuláš, Kat. základov inžinierstva, 22.6.2007. v rámci bilaterálneho projektu JSPS-SAV-ZU-FMFI 2007-2009 "Pasivácia defektných stavov v kremíkových štruktúrach a aplikácia výsledkov pri optimalizácii parametrov solárnych článkov"

22

Jurečka S.:
Optical properties of multilayer semiconductor structures.
Applied Physics of Condensed Matter APCOM 2007, Hotel Bystrá, Jánska dolina, June 27 - 29, 2007

23

Jurečka S., Pinčík E., Brunner R., Takahashi M.:
Optical properties of CN passivated semiconductor structure.
V. International Workshop on Semiconductor Surface Passivation SSP 2007, September 16-19, 2007. Geovita, Zakopane, Poland

24

Jurečka S.:
Analysis of the spectral reflectance of multilayer structure. Vedecký seminár riešiteľov grantového projektu (Takeshi Matsumoto - Kentaro Imamura, Department of functional ceramics, Kobayashi laboratories, Osaka University, Japan.) L. Mikuláš, Kat. základov inžinierstva, 19.11.2007. v rámci grantu JSPS-SAV-ZU-FMFI 2007-2009 "Pasivácia defektných stavov v kremíkových štruktúrach a aplikácia výsledkov pri optimalizácii parametrov solárnych článkov"
KZI L. Mikuláš 2007

25

Jurečka S., Jurečková M., Kobayashi H., Takahashi M., Madani M., Pinčík E.:
Statistical and fractal properties of semiconductor surface roughness.
Advances in Electrical and Electronic Engineering 2008, Vol.7, No.1-2, p.377-381.

26

Jurečka S., Pinčík E., Kobayashi H, Takahashi M.
Microstructural and optical properties of Si/a-SiC:H/SiO2 thin films.
Proceedings of the Applied Physics of Condensed Matter APCOM 2008, KRU Bystrá, Liptovský Ján, June 25 - 27, 2008, p.96-100.

27

Jurečka S., Jurečková M., Chovanec F., Kobayashi H, Takahashi M., Mikula M., Pinčík E.:
On the topographic and optical properties of SiC/SiO2 surfaces
Solid State Surfaces and Interfaces, Smolenice, 27.11.2008

28

E. Pinčík, H. Kobayashi, R. Brunner, M. Takahashi, K. Imamura, M. Kučera, T. Shishido, J. Rusnák, T. Matsumoto, M. Jergel, M. Madani, M. Mikula, M. Uragou, S. Jurečka and M. Kopani
On Electrical, Optical and Structural Properties of Si-based Structures
Solid State Surfaces and Interfaces, Smolenice, 27.11.2008

29

Jurečka S., Jurečková M., Chovanec F., Pinčík E.:
Characterization of the surfaces of semiconductor systems by fractals
The 15th International Conference on Applied Physics of Condensed Matter, APCOM 2009, June 24-26. 2009, KRÚ Bystrá Liptovský Ján

30

Jurečka S., Kobayashi H, Takahashi M., Matsumoto T., Jurečková M., Chovanec F., Pinčík E.:
On the influence of the surface roughness onto the the ultrathin SiO2/Si structure properties
Progress in Applied Surface, Interface and Thin Film Science, SURFINT-SREN II 2009, November 16-19. 2009, Florence, Italy.

31

E. Pinčík, H. Kobayashi, J. Rusnák, W.B. Kim, R. Brunner, M. Takahashi, S. Jurečka, M. Kučera, M. Mikula:
On HCN passivated very-thin oxide/Si structures prepared by high-tempeature and low-temperature wet chemical process
Progress in applied surface, interface and thin film science, November 16-19, 2009, Florence, Italy.

32

Jurecka S., Mullerová J.:
Study of microstructural and optical properties of a-Si:H thin films.
17th Slovak-Czech-Polish Optical Conference "Wave and quantum aspects of contemporary optics", SCPOC 2010, Sptember 6-10. 2010, Liptovský Ján.

33

Jurečka S., Ohnaka A., Kobayashi H.:
Study of structural and optical properties of textured semiconductor surfaces.
16th International Conference on Applied Physics of Condensed Matter, APCOM 2010, June 16-18. 2010, Malá Lučivná, pp. 268-273.

34

Stanislav Jurečka, Woo-Byoung Kim, Masao Takahashi, Hikaru Kobayashi, Emil Pinčík:
Study of interface states in MOS structure with ultrathin NAOS oxide.
Solid state surfaces and interfaces, SSSI 2010, Book of abstracts, November 22-25. 2010, Smolenice Castle.

35

Jurečka S., Müllerová J., Dado M.:
The cavity resonator design: stochastic optimization of the transmission line model.
Photonics Prague 2011, The 7th International Conference on Photonics, Devices and Systems. August 24-26. 2011, Prague.

36

Jurečka S., Kobayashi H., Kim W.B., Pinčík E.:
Properties of charge states in MOS structure with ultrathin oxide layer.
VII International Workshop on Semiconductor Surface Passivation, SSP 2011, Kraków, Poland, 11-15.9.2011.

37

Jurečka S., Pinčík E.:
Fyzika slnečného článku.
ALER 2011, Liptovský Ján, Hotel UNA, 06-07.10.2011

38

Jurečka S., Pinčík E.:
Optical methods for analysis of thin dielectric films.
APCOM 2013

39

Jurečka S., Angermann H., Kobayashi H., Takahashi M., Pinčík E.:
Multifractal analysis of textured silicon surfaces.
Semiconductor Surface Passivation, Krakow 2013

40

Jurečka S.:
Investigation of tunneling current in MOS devices with ultrathin gate oxide.
Solid State Surfaces and Interfaces, Smolenice 2013


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